Imaging XPS—A new technique, I—principles
- 1 February 1983
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 5 (1), 13-19
- https://doi.org/10.1002/sia.740050105
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Photoelectron spectromicroscopyNature, 1981
- Selected area X-ray photoelectron spectroscopySurface and Interface Analysis, 1981
- Auflösungsverbesserung durch entfaltungJournal of Electron Spectroscopy and Related Phenomena, 1978
- Microanalyse et microscopie photoélectroniques X: principe et performances prévisiblesRevue de Physique Appliquée, 1975
- The Focusing of Charged Particles by a Spherical CondenserPhysical Review B, 1938