Measurements of nondegenerate optical nonlinearity using a two-color single beam method
- 18 November 1991
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (21), 2666-2668
- https://doi.org/10.1063/1.105933
Abstract
A two‐color ‘‘z’’ scan method is introduced to characterize the nonlinear refraction of optical materials in their absorptive region. We demonstrate the method by measuring the sign and the magnitude of the frequency nondegenerate nonlinearity in the absorptive region of semiconductor doped glasses.Keywords
This publication has 13 references indexed in Scilit:
- Intensity-dependent absorption and luminescence in semiconductor-doped glassesJournal of the Optical Society of America B, 1990
- Laser-induced irreversible change of the carrier-recombination process in CdSXSe_1–X-doped glassesJournal of the Optical Society of America B, 1990
- Ultrafast chi /sup (3)/-related processes in semiconductor doped glassesIEEE Journal of Quantum Electronics, 1990
- Sensitive measurement of optical nonlinearities using a single beamIEEE Journal of Quantum Electronics, 1990
- High-sensitivity, single-beam n_2 measurementsOptics Letters, 1989
- Nonlinear dynamical relaxation processes in semiconductor-doped glasses at liquid-nitrogen temperatureJournal of the Optical Society of America B, 1989
- Optical Nonlinearities and Ultrafast Carrier Dynamics in Semiconductor Doped GlassesJournal of Modern Optics, 1988
- Laser annealing effect on carrier recombination time in CdSXSe_1–X-doped glassesJournal of the Optical Society of America B, 1988
- Interferometric measurement of the nonlinear index of refraction, n2, of CdSxSe1−x-doped glassesApplied Physics Letters, 1986
- Degenerate four-wave mixing in semiconductor-doped glassesJournal of the Optical Society of America, 1983