Anodization of Silicon in RF Induced Oxygen Plasma

Abstract
Silicon dioxide films were grown on Si substrates by anodization in RF induced oxygen plasma at the pressure of 0.2 Torr and temperature of 600°C. SiO2 films of 1 µm in thickness were obtained within one hour. The selective oxidation was studied and Al2O3 was found to be effective in masking against the oxidation. The bird's beak shaped structure was greatly reduced.