Fourier analysis of EXAFS data, a self-contained fortran program-package
- 1 December 1980
- journal article
- Published by Elsevier in Computer Physics Communications
- Vol. 21 (1), 91-96
- https://doi.org/10.1016/0010-4655(80)90078-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- EXAFS: a new parameterization of phase shiftsJournal of the American Chemical Society, 1977
- New Method to Measure Structural Disorder: Application to GeGlassPhysical Review Letters, 1975
- Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected resultsPhysical Review B, 1975
- Extended x-ray-absorption fine-structure technique. III. Determination of physical parametersPhysical Review B, 1975
- Theory of the extended x-ray-absorption fine structurePhysical Review B, 1974
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971
- A guided tour of the fast Fourier transformIEEE Spectrum, 1969