Study of the Lattice Defect in Martensite by X-Ray Diffraction (I)
- 1 October 1962
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 1 (4), 210-217
- https://doi.org/10.1143/jjap.1.210
Abstract
The profiles of Debye-Scherrer lines of martensite crystals in Fe-27%Ni alloy were measured by an X-ray diffractometer and analysed by Fourier method. As a reference the same experiment was made for filed iron. The results show that there is a large distortion in the martensite and that the widths of the lines have a strong index-dependence. The latter fact is interpreted by the existence of lattice strains and stacking faults (deformation faults or twin faults). These facts are discussed in comparison with the previous results by electron microscopy.Keywords
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