Calculating emittance from images of undulator radiation
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A method is presented for calculating the emittance of an electron beam from scans of undulator radiation. Scans are affected by electron beam properties, radiation angular distribution, imaging pinhole diffraction, smearing from scanning, and the difference between scan and beam axes, all of which are incorporated. Adding-in-quadrature is also discussed. An application to the low-emittance lattice of the storage ring PEP (Positron-Electron Project) is discussed.Keywords
This publication has 2 references indexed in Scilit:
- Observation of x-ray undulator radiation on PEP (invited)Review of Scientific Instruments, 1989
- Brightness and coherence of synchrotron radiation and high-gain free electron lasersNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987