Sensitization of inconel 600. I. Scanning auger and optical microscopy

Abstract

The effect of impurity elements such as carbon, phosphorus, boron and silicon on the microstructural characteristics and grain-boundary chemistry of Inconel 600 has been investigated using optical microscopy and scanning Auger electron microscopy techniques. Of the elements added, only phosphorus was detected at grain boundaries and at the carbide-matrix interface. Carbon and boron were found to form discrete precipitates while silicon did not affect significantly the microstructural characteristics of the material. Sulphur-rich particles were found at the fractured surfaces and were associated with chromium carbides and titanium nitrides.