A structural study of the A1-Ge(001) interface using total-reflected x-ray diffraction
- 30 June 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 34 (11), 843-846
- https://doi.org/10.1016/0038-1098(80)90108-8
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- CXVII. The total reflexion of X-raysJournal of Computers in Education, 1923