System for Displaying Thin-Film Plated Wire Switching Characteristics Under Disturbed Conditions
- 1 September 1964
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 35 (9), 1163-1166
- https://doi.org/10.1063/1.1718987
Abstract
A simple and rapid test system for displaying the switching characteristics of thin‐film plated wire computer memory elements under disturbed write conditions is described. The characteristics are displayed on an oscilloscope, eliminating the need for manual plotting of data. The instrument design and construction is described and typical results are presented.Keywords
This publication has 2 references indexed in Scilit:
- Effect of Skew on the Performance of Magnetic-Film Storage CellsJournal of Applied Physics, 1963
- Magnetic Film Memory DesignProceedings of the IRE, 1961