Crosstalk Phenomenon in Coupled Microstrip Lines Laid on Semi-Conducting Substrates
- 1 October 1985
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Crosstalk phenomena and pulse propagation in coupled microstrip lines on insulating and semiconducting substrates are analysed. Propagation characteristics of these lines are obtained by Spectral Domain Analysis in order to avoid any error involved by the use of analytical model and T.E.M. approximation. Time domain results are calculated by a conventional fast Fourier transform. Effects of semiconducting layer, substrate thickness, lines spacing and length, loading impedances, on crosstalk and transfer are investigated.Keywords
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