The Ionization of Sulphur Dioxide by Electron Impact

Abstract

The mass-spectrograph previously described has been used to study ionization by electron impact in S${\mathrm{O}}_2$. S${\mathrm{O}}_2^{+}$ ions appear at 13.1±0.3 volts, S${\mathrm{O}}^{+}$ ions at 16.5±0.5 and ions of mass 32, either ${\mathrm{S}}^{+}$ or ${\mathrm{O}}_2^{+}$ appear at 16.0±0.7 and increase sharply at 22.3±1.0. No ${\mathrm{O}}^{+}$ ions are observed. The probable processes of formation of these ions are discussed.