Study on catalytic chemical vapor deposition method to prepare hydrogenated amorphous silicon
- 1 June 1989
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 65 (11), 4396-4402
- https://doi.org/10.1063/1.343278
Abstract
A new type of thermal chemical vapor deposition (CVD) method is presented. In the method, material gases are decomposed by catalytic or pyrolytic reaction with a heated catalyzer, so that films can be deposited at temperatures less than 300 °C without any plasma or photochemical excitation, and the method is particularly called ‘‘Catalytic-CVD.’’ Hydrogenated amorphous silicon films are deposited by this method, and the deposition mechanism is also investigated. It is found that device-quality amorphous silicon films can be obtained and that inactive species, which are generated at the catalyzer and transported without gas-phase reactions, are key species to make a high-quality film by this method.Keywords
This publication has 16 references indexed in Scilit:
- Catalytic chemical vapor deposition method to prepare high quality hydro-fluorinated amorphous siliconJournal of Applied Physics, 1988
- High-quality amorphous silicon germanium produced by catalytic chemical vapor depositionApplied Physics Letters, 1987
- Catalytic Chemical Vapor Deposition (CTC–CVD) Method Producing High Quality Hydrogenated Amorphous SiliconJapanese Journal of Applied Physics, 1986
- Amorphous silicon produced by a new thermal chemical vapor deposition method using intermediate species SiF2Applied Physics Letters, 1985
- Properties of hydrogenated amorphous silicon prepared by chemical vapor depositionJournal of Applied Physics, 1984
- Optical and electrical properties of amorphous silicon films prepared by photochemical vapor depositionApplied Physics Letters, 1983
- Efficient visible luminescence from hydrogenated amorphous siliconPhysica B+C, 1983
- Kinetics and mechanism of amorphous hydrogenated silicon growth by homogeneous chemical vapor depositionApplied Physics Letters, 1981
- The hydrogen content of a-Ge:H and a-Si:H as determined by ir spectroscopy, gas evolution and nuclear reaction techniquesJournal of Non-Crystalline Solids, 1980
- Electronic properties of substitutionally doped amorphous Si and GePhilosophical Magazine, 1976