Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
- 12 November 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (20), 2089-2091
- https://doi.org/10.1063/1.103950
Abstract
An atomic force microscope capable of measuring, simultaneously yet separately, lateral (‘‘frictional’’) and normal forces is described. A direction‐dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.Keywords
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