Rankings
Publications
Search Publications
Cited-By Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Login
Register
Home
Publications
Frequency response of the surface inversion layer in silicon
Home
Publications
Frequency response of the surface inversion layer in silicon
Frequency response of the surface inversion layer in silicon
SH
S.R. Hofstein
S.R. Hofstein
KZ
K.H. Zaininger
K.H. Zaininger
GW
G. Warfield
G. Warfield
Publisher Website
Google Scholar
Add to library
Cite
Download
Share
Download
1 January 1964
journal article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
Proceedings of the IEEE
Vol. 52
(8)
,
971-972
https://doi.org/10.1109/proc.1964.3196
Abstract
No abstract available
Keywords
FREQUENCY RESPONSE
RESPONSE SURFACE METHODOLOGY
SILICON
CAPACITANCE
HYSTERESIS
OXIDATION
MOS CAPACITORS
DELAY
SEMICONDUCTOR PROCESS MODELING
PREDICTIVE MODELS
Cited by 20 articles