Angle-resolved X-Ray photoelectron spectroscopy for the characterization of GaAs(OO1) surfaces
- 31 December 1987
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 43 (3), 263-286
- https://doi.org/10.1016/0368-2048(87)80006-3
Abstract
No abstract availableKeywords
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