Self-organization of germanium nanoislands obtained in silicon by molecular-beam epitaxy
- 1 January 1998
- journal article
- Published by Pleiades Publishing Ltd in JETP Letters
- Vol. 67 (1), 48-53
- https://doi.org/10.1134/1.567626
Abstract
Nanometer germanium islands in epitaxial layers of silicon are obtained by molecular-beam epitaxy. The dimensions and shapes of the islands are determined in an atomic-force microscope. The photoluminescence spectra are found to contain lines that can be interpreted as quasidirect optical transitions in the islands. It is concluded on the basis of optical and microprobe measurements and theoretical calculations of the energies of electronic states that silicon is dissolved in the germanium islands. Values of the germanium and silicon contents in the solid solution are presented.Keywords
This publication has 6 references indexed in Scilit:
- Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor depositionApplied Physics Letters, 1997
- Growth and characterization of self-assembled Ge-rich islands on SiSemiconductor Science and Technology, 1996
- Formation and optical properties of SiGe/Si quantum structuresApplied Surface Science, 1996
- Ultranarrow Luminescence Lines from Single Quantum DotsPhysical Review Letters, 1995
- Growth morphology and the equilibrium shape: The role of ‘‘surfactants’’ in Ge/Si island formationPhysical Review Letters, 1993
- Dislocation-free Stranski-Krastanow growth of Ge on Si(100)Physical Review Letters, 1990