Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials
- 27 December 1999
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (26), 4198-4200
- https://doi.org/10.1063/1.125581
Abstract
We studied the response of a cantilever tapping on polydimethylsiloxane(PDMS) samples of different crosslink density. It is shown experimentally that the tip deeply penetrates into the compliant PDMS samples. A more compliant material leads to a larger indentation such that at a given set-point ratio the indentation force is nearly constant on samples of different elastic moduli. This confirms the simulations by J. Tamayo and R. Garcia [Appl. Phys. Lett. 71, 2394 (1997)] that phase contrast acquired at constant set point does not depend on the sample’s modulus if other contrast relevant parameters remain identical. PDMS samples of different crosslink density are distinguished in terms of amplitude and phase versus distance measurements if the tip-sample interaction is made substantially large and indentation is taken into account.Keywords
This publication has 9 references indexed in Scilit:
- A unifying view on some experimental effects in tapping-mode atomic force microscopyJournal of Applied Physics, 1999
- Description of the frequency dependence of the amplitude and phase angle of a silicon cantilever tapping on a silicon substrate by the harmonic approximationSurface Science, 1998
- Description of phase imaging in tapping mode atomic force microscopy by harmonic approximationSurface Science, 1998
- Developments and perspectives of scanning probe microscopy (SPM) on organic materials systemsMaterials Science and Engineering: R: Reports, 1998
- Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopyApplied Physics Letters, 1997
- CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPYAnnual Review of Materials Science, 1997
- Scanning Probe Microscopy of Polymer SurfacesRubber Chemistry and Technology, 1997
- Phase imaging and stiffness in tapping-mode atomic force microscopySurface Science, 1997
- Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopySurface Science, 1993