Mechanical thickness monitors and ratemeters for vacuum evaporation
- 1 March 1966
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 43 (3), 182-185
- https://doi.org/10.1088/0950-7671/43/3/315
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Thin Films of Niobium Tin by CodepositionJournal of Applied Physics, 1964
- Reduction of Static Friction by Sonic VibrationsJournal of Applied Physics, 1959
- Velocity Distributions in Potassium and Thallium Atomic BeamsPhysical Review B, 1955