Automated Visual Inspection: A Survey
- 1 November 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. PAMI-4 (6), 557-573
- https://doi.org/10.1109/tpami.1982.4767309
Abstract
This paper surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included.Keywords
This publication has 137 references indexed in Scilit:
- A novel generalization of the gray-scale histogram and its application to the automated visual measurement and inspection of wooden PalletsImage and Vision Computing, 2007
- Signal classification for automatic industrial inspectionIEE Proceedings E Computers and Digital Techniques, 1982
- Component Verification SystemIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1980
- A Design Study of an Automatic System for On-line Detection and Classification of Surface Defects on Cold-rolled Steel StripOptica Acta: International Journal of Optics, 1978
- Inspection for defects of a mask containing one‐ to submicrometer patterns using a scanning electron microscope and feature extraction methodJournal of Vacuum Science and Technology, 1978
- The prospects for sensory arrays and microprocessing computers in manufacturing industryRadio and Electronic Engineer, 1977
- Intelligent machines—commercial potentialRadio and Electronic Engineer, 1977
- Hardware for visual image processingIEEE Transactions on Circuits and Systems, 1975
- Patterns in pattern recognition: 1968-1974IEEE Transactions on Information Theory, 1974
- Selection, inspection, and naming in visual search.Journal of Experimental Psychology, 1972