Observation of dislocations in a synthetic quartz crystal by light scattering tomography

Abstract
Dislocations in a synthetic quartz crystal have been detected by light scattering tomography. The scattering factor of optical waves from an edge dislocation has been calculated by a method very similar to that used in the calculation of the scattering factors for X-rays, because the polarizability in an optical frequency is caused by the displacement of outer-shell (or bonding) electrons by the electric field of the light wave. The images caused by undecorated dislocations were clear lines and depended sharply on the direction of the incident beam, which was correctly indicated by the calculation. The images due to dislocations decorated by impurities had many dots and were insensitive to the direction of the incident beam.