p-Polarized Reflectances for Transparent Thin Films on Transparent Substrates
- 1 July 1965
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 55 (7), 857-859
- https://doi.org/10.1364/josa.55.000857
Abstract
Theoretical conditions giving zero p reflectance {Rp (α)=0) are discussed for both single and two-layer transparent coatings. The p reflectances of single-film coatings are studied in some detail taking into account variations of thicknesses and refractive indexes. The conditions Rp(45°) = 0 for two-layer coating systems are also discussed.Keywords
This publication has 8 references indexed in Scilit:
- Equi-reflectance Contours of Double-layer Anti-reflection CoatingsOptica Acta: International Journal of Optics, 1964
- Determination of the Refractive Index of Thin Dielectric Films*Journal of the Optical Society of America, 1964
- Some Computed Optical Properties of Antireflection CoatingsJournal of the Optical Society of America, 1962
- Study of the performance of dielectric thin film beam dividing systemsBritish Journal of Applied Physics, 1961
- The Transmission and Degree of Polarization of Quarter-wave Stacks at Non-normal IncidenceOptica Acta: International Journal of Optics, 1961
- Brewster Angle Apparatus for Thin Film Index MeasurementsJournal of the Optical Society of America, 1957
- Computations in thin film opticsVacuum, 1954
- Anwendung der Vierpoltheorie auf die Probleme der optischen Reflexionsminderung, Reflexionsverstärkung und der Interferenzfilter. (Mit 2 Abbildungen)Annalen der Physik, 1949