Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors
- 1 April 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 109-110, 580-583
- https://doi.org/10.1016/0168-583x(95)00973-6
Abstract
No abstract availableKeywords
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