Homogeneity along Cl-compensated thm grown CdTe ingot
- 1 January 1977
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 12 (2), 195-198
- https://doi.org/10.1051/rphysap:01977001202019500
Abstract
Different characterization techniques (TSC, time of flight, nuclear detection) have been used for assessment of Cl-compensated THM grown crystals, in which the chlorine was introduced in various manners. It is observed that the net carrier concentration increases from the beginning to the end of the ingots. Suggestion is made that this may result from background impurities segregationKeywords
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