Quantitative Electron Probe Microanalysis of Thin Films
- 1 January 1975
- journal article
- Published by Japan Institute of Metals in Transactions of the Japan Institute of Metals
- Vol. 16 (11), 697-701
- https://doi.org/10.2320/matertrans1960.16.697
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Changes in the Composition and Structure of Al-Sn and Cu-Sn-Pb Bearing Materials due to Friction and WearJournal of the Japan Institute of Metals and Materials, 1972
- Quantitative Microprobe Analysis of Thin Insulating FilmsAdvances in X-ray Analysis, 1967
- Characteristic fluorescence corrections in electron-probe microanalysisBritish Journal of Applied Physics, 1965