Comments on the reliability of GaAs Stripe-Geometry juntion lasers
- 1 June 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 6 (6), 372-373
- https://doi.org/10.1109/jqe.1970.1076468
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Role of optical flux and of current density in gradual degradation of GaAs injection lasersIEEE Journal of Quantum Electronics, 1969
- A low-threshold room-temperature injection laserIEEE Journal of Quantum Electronics, 1969
- A technique for the preparation of low-threshold room-temperature GaAs laser diode structuresIEEE Journal of Quantum Electronics, 1969
- Optimum Stripe Width for Continuous Operation of GaAs Junction LasersJournal of Applied Physics, 1969
- Physical basis of noncatastrophic degradation in GaAs injection lasersProceedings of the IEEE, 1969
- HERMITE-GAUSSIAN MODE PATTERNS IN GaAs JUNCTION LASERSApplied Physics Letters, 1967