X-ray-standing-wave—modulated electron emission near absorption edges in centrosymmetric and noncentrosymmetric crystals
- 1 September 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (5), 2453-2461
- https://doi.org/10.1103/physrevb.30.2453
Abstract
Energy-dispersive electron-emission yields were measured for (111) Bragg reflections of x rays from Ge and GaAs crystals. The reflection angle was changed continuously over the Bragg reflection range, thus causing the internal x-ray-standing-wave pattern to move across the atomic planes. With the use of synchrotron radiation, these measurements were performed at photon energies below and above the Ga and As absorption edges. This introduces an energy-dependent position shift of the noncentrosymmetric diffraction planes relative to the atomic planes. It is shown how to determine, from such measurements, (i) the dispersion parameters and ; (ii) lattice deviations, including amorphous and crystalline surface layers; (iii) a mean electron escape depth; and (iv) crystal polarity.
Keywords
This publication has 20 references indexed in Scilit:
- X-Ray-Standing-Wave Atom Location in Heteropolar Crystals and the Problem of ExtinctionPhysical Review Letters, 1983
- Solution to the Surface Registration Problem Using X-Ray Standing WavesPhysical Review Letters, 1982
- The investigation of disturbed surface layer structure by the external photoeffect under X-ray diffraction conditionsPhysica Status Solidi (a), 1982
- Coherent Compton EffectPhysical Review Letters, 1981
- Analytical approximations for X-ray attenuation coefficientsNuclear Instruments and Methods, 1981
- Secondary processes accompanying X-ray diffraction. Thermal diffuse scatteringActa Crystallographica Section A, 1981
- X-Ray Standing Waves at Crystal SurfacesPhysical Review Letters, 1980
- X-ray intensity measurements on large crystals by energy-dispersive diffractometry. IV. Determination of anomalous scattering factors near the absorption edges of GaAs by the one-intensity-ratio methodActa Crystallographica Section A Foundations and Advances, 1979
- Use of dynamical diffraction effects on x-ray fluorescence to determine the polarity of GaP single crystalsPhysical Review B, 1976
- Die Absorption von R ntgenstrahlen im Fall der InterferenzThe European Physical Journal A, 1950