A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984

1 January 1984

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 31 (6), 1186-1189
https://doi.org/10.1109/tns.1984.4333480

Abstract

A summary of eleven JPL tests for single event upset (SEU) performed at various accelerators, from May 1982 through January 1984, is presented. This data may be regarded as an update or follow-on to the large compilation of JPL data taken through May 1982, published in the 1983 IEEE issue of this conference. For brevity, most of the data is given for the most ionizing beam used, only. Whenever available, both cross section and LET threshold is tabulated.

Keywords

SINGLE EVENT UPSET
TESTING
CYCLOTRONS
LINEAR PARTICLE ACCELERATOR
PROM
LIFE ESTIMATION
ION ACCELERATORS
PROTONS
SPACE TECHNOLOGY
PARTICLE BEAMS

This publication has 1 reference indexed in Scilit:

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
IEEE Transactions on Nuclear Science, 1983

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