Mapping projected potential, interfacial roughness, and composition in general crystalline solids by quantitative transmission electron microscopy
- 20 December 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 71 (25), 4150-4153
- https://doi.org/10.1103/physrevlett.71.4150
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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