Surface extended x-ray absorption fine structure in the soft-x-ray region: Study of an oxidized Al surface

Abstract
The extended x-ray absorption fine structure (EXAFS) above the oxygen K edge (hν535 eV) has been investigated for an oxidized Al surface. The spectra were obtained using monochromatized synchrotron radiation in the 500-800-eV range and detecting the secondary electron yield from the sample. Pronounced EXAFS was observed extending at least 300 eV beyond the edge. Experiments of the present kind appear to have great applicability for the study of the oxidation and catalytic activity of surfaces.