The application of thin layer x-ray fluorescence analysis to oxide composition studies on stainless steels

Abstract

A linear relationship between x-ray intensity and element concentration can be obtained in x-ray fluorescence analysis if the specimen is very thin, so that the usual matrix absorption and enhancement effects are negligible. A simple powder layer method has been developed to follow changes in oxide film composition during high temperature oxidation of stainless steels. A standard deviation of the order of 7% in the experimental determination of the principal elements present in the surface films (Fe, Cr, Ni, Mn and Si) is readily attained. For mechanistic studies of this type, the degree of accuracy is satisfactory; more importance is attached to the rapid examination of large numbers of specimens oxidized over a wide range of conditions.