Electron and Ion Beam-Enhanced Adhesion
- 1 January 1983
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Thin film metallization of oxides in microelectronicsThin Solid Films, 1973
- Measurement of adhesion of thin evaporated films on glass substrates by means of the direct pull methodThin Solid Films, 1973
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- Measurement of adhesion of thin filmsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1960