X-Ray Studies of Surface Layers of Crystals
- 1 January 1946
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 25 (1), 136-155
- https://doi.org/10.1002/j.1538-7305.1946.tb00898.x
Abstract
When a crystalline substance is sawed, ground, lapped or polished, the crystal structure adjacent to the worked surface is distorted and ruptured. Since the selective diffraction of X-rays by a crystal is a result of the orderly arrangement of the pl...Keywords
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