Method for Making Successive Replicas of the Same Spot
- 1 April 1958
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 29 (4), 608-610
- https://doi.org/10.1063/1.1723238
Abstract
A technique is described in which use is made of the slit type electron microscope specimen carrier for replicating successively the same spot on a metal sample. The main advantage is that no specialized apparatus is required. By using the slit type specimen carrier a relatively large undisturbed field of view is obtained. A series of electron micrographs showing the formation and growth of slip lines on an α‐brass single crystal is used to demonstrate the capabilities of the method.Keywords
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