Band Alignment and Internal Field Mapping in Solar Cells
- 26 October 2011
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry Letters
- Vol. 2 (22), 2872-2876
- https://doi.org/10.1021/jz201265z
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Two-Dimensional X-ray Photoelectron Spectroscopy for Composite Surface AnalysisAnalytical Chemistry, 2008
- Chemically Resolved Photovoltage Measurements in CdSe Nanoparticle FilmsThe Journal of Physical Chemistry B, 2006
- Submolecular Potential Profiling Across Organic MonolayersNano Letters, 2006
- e-beam-referenced work-function evaluation in an x-ray photoelectron spectrometerJournal of Applied Physics, 2005
- Chemically resolved electrical measurements using x-ray photoelectron spectroscopyApplied Physics Letters, 2004
- Time-Resolved XPS Analysis of the SiO2/Si System in the Millisecond RangeThe Journal of Physical Chemistry B, 2004
- Controlled surface charging as a depth-profiling probe for mesoscopic layersNature, 2000
- Band alignment at organic-inorganic semiconductor interfaces: α-NPD and CuPc on InP(110)Journal of Applied Physics, 1999
- Heterojunctions: Definite breakdown of the electron affinity rulePhysical Review B, 1986
- Schottky barriers: An effective work function modelApplied Physics Letters, 1981