Dislocation interaction with irradiation damage in the high voltage electron microscope
- 1 January 1973
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 27 (1), 257-263
- https://doi.org/10.1080/14786437308228928
Abstract
A form of the weak beam technique is described and shown to provide useful information about the dislocation interaction with the irradiation-produced point defects in the high voltage electron microscope. Possible mechanisms to explain the preliminary experimental observations are discussed.Keywords
This publication has 5 references indexed in Scilit:
- The weak beam technique as applied to the determination of the stacking-fault energy of copperPhilosophical Magazine, 1971
- The effect of diffusivity gradients on diffusion to dislocationsPhilosophical Magazine, 1971
- The kinetics of migration of point defects to dislocationsReports on Progress in Physics, 1970
- Investigations of dislocation strain fields using weak beamsPhilosophical Magazine, 1969
- Electron displacement damage in copper and aluminium in a high voltage electron microscopePhilosophical Magazine, 1968