Dependence of flicker noise in MOSFETs on geometry
- 1 March 1977
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 20 (3), 267
- https://doi.org/10.1016/0038-1101(77)90196-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Characterization of low 1/f noise in MOS transistorsIEEE Transactions on Electron Devices, 1971
- Surface state related noise in MOS transistorsSolid-State Electronics, 1970
- Theory of low frequency noise in Si MOST'sSolid-State Electronics, 1970
- Low frequency noise in MOS transistors—I TheorySolid-State Electronics, 1968