A gas probe analysis of structure in bulk and surface layers of vitreous silica
- 1 May 1982
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 49 (1-3), 299-307
- https://doi.org/10.1016/0022-3093(82)90126-0
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- The lognormal distribution in the random network structureJournal of Non-Crystalline Solids, 1981
- A Gas‐Probe Analysis of Structure in Silicate GlassesJournal of the American Ceramic Society, 1980
- Oxygen and silicon diffusion-controlled processes in vitreous silicaJournal of Non-Crystalline Solids, 1980
- The defect structure of vitreous SiO2 films on silicon. I. Structure of vitreous SiO2 and the nature of the Si-O bondPhysica Status Solidi (a), 1980
- The interstitial structure of vitreous silicaJournal of Non-Crystalline Solids, 1978
- Oxidation of silicon by water and oxygen and diffusion in fused silicaThe Journal of Physical Chemistry, 1976
- Diffusion and Permeation of He, Ne, Ar, Kr, and D2 through Silicon Oxide Thin FilmsThe Journal of Chemical Physics, 1971
- Properties and structure of vitreous silica. IIJournal of Non-Crystalline Solids, 1971
- General Relationship for the Thermal Oxidation of SiliconJournal of Applied Physics, 1965
- THE ATOMIC ARRANGEMENT IN GLASSJournal of the American Chemical Society, 1932