Moiré Gauging of In-Plane Displacement Using Double Aperture Imaging
- 1 August 1972
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 11 (8), 1778-1781
- https://doi.org/10.1364/ao.11.001778
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 8 references indexed in Scilit:
- Recording distortion in irregularly shaped objectsOptics & Laser Technology, 1971
- A double exposure technique for speckle pattern interferometryJournal of Physics E: Scientific Instruments, 1971
- Recording of In-plane Surface Displacement by Double-exposure Speckle PhotographyOptica Acta: International Journal of Optics, 1970
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970
- Holographic measurement of surface distortion in three dimensionsOptics Technology, 1969
- Moiré Gauging Using Optical Interference PatternsApplied Optics, 1969
- Measurement of in-plane surface strain by hologram interferometryJournal of Physics E: Scientific Instruments, 1968
- Moiré Patterns: Their Application to Refractive Index and Refractive Index Gradient MeasurementsJournal of the Optical Society of America, 1964