Determination of the impurity concentrations in a semiconductor from Hall coefficient measurements
- 1 August 1957
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 8 (8), 340-343
- https://doi.org/10.1088/0508-3443/8/8/307
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Absorption spectra of impurities in silicon—IJournal of Physics and Chemistry of Solids, 1956
- Radioactivation Analysis of Phosphorus in SiliconNature, 1955
- Cyclotron Resonance of Electrons and Holes in Silicon and Germanium CrystalsPhysical Review B, 1955
- Effective Masses of Holes in SiliconPhysical Review B, 1954
- Electrical Properties of Silicon Containing Arsenic and BoronPhysical Review B, 1954
- Mass Spectrographic Analysis of SolidsAnalytical Chemistry, 1954
- Electrical Properties of-Type GermaniumPhysical Review B, 1954