Calculated yields and fluctuations for electron degradation in liquid water and water vapor
- 15 March 1986
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 84 (6), 3182-3188
- https://doi.org/10.1063/1.450247
Abstract
Two sets of physical interaction cross sections for detailed electron track‐structure calculations in liquid water and water vapor have been used to investigate the possible magnitude of phase‐dependent differences in the primary yields of ionizations and their fluctuations produced during complete slowing down of electrons in the energy range from 10 eV to 10 keV. For fast electrons the calculated values of the mean energy absorbed per ion pair are 25.8 eV/ip for the liquid as compared to 30.0 eV/ip for the vapor; both results are consistent with experimental data. A similar phase effect is found in the ionization yields from each molecular subshell, since essentially the same partitioning of the total ionization cross section has been used in the calculations for the liquid and the vapor. The relative fluctuations of the ionization yields as described by the Fano factor are 0.15 for the liquid and 0.25 for the vapor; the Fano factors for each single molecular orbital are typically between 0.7 and 0.9 in both phases. The distributions in the total number of ionizations produced by the complete slowing down of electrons with initial energies above about 100 eV are Gaussian within about two standard deviations around the mean. The significance of the differences in the yields of ionizations and excitations calculated for both phases is discussed. In the absence of adequate experimental data for the basic processes, the differences are interpreted in terms of the respective assumptions made for single scattering processes.Keywords
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