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Sputter Profiling Through Ni/Fe Interfaces by Auger Electron Spectroscopy
Home
Publications
Sputter Profiling Through Ni/Fe Interfaces by Auger Electron Spectroscopy
Sputter Profiling Through Ni/Fe Interfaces by Auger Electron Spectroscopy
TC
T. J. Chuang
T. J. Chuang
KW
K. Wandelt
K. Wandelt
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1 May 1978
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 22
(3)
,
277-284
https://doi.org/10.1147/rd.223.0277
Abstract
No abstract available
Cited by 14 articles