An AC Bridge for Semiconductor Resistivity Measurements Using a Four-Point Probe
- 1 May 1961
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 40 (3), 885-919
- https://doi.org/10.1002/j.1538-7305.1961.tb03245.x
Abstract
A new direct-reading ac bridge circuit has been developed to measure semiconductor bulk and sheet resistivity, using a four-point (or other appropriate) probe. The range of resistivity which can be measured is from 0.001 to 10,000 ohm-cm. Resistivity...This publication has 1 reference indexed in Scilit:
- Resistivity Measurements on Germanium for TransistorsProceedings of the IRE, 1954