Emittance Measurements on Negative Ion Sources
- 1 April 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 23 (2), 1155-1161
- https://doi.org/10.1109/TNS.1976.4328425
Abstract
An automated system has been developed for measuring the emittance of beams from negative ion sources. The data are stored as two-dimensional spectra in a kicksorter and subsequently analysed with a PDP-10 computer. The system was first used to measure the properties of, and assess the value of design changes to, a Middleton sputter source. Subsequently, the emittance of several different types of negative ion source have been compared. A retarding field energy analyzer of high resolution has been used to measure the beam energy spreads from the Middleton sputter source and from other negative ion sources, including a direct extraction duoplasmatron and a sputter Penning source. Typical spectra have a width of a few eV, with a small group of higher energy ions.Keywords
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