Detection of metallic trace impurities on Si(100) surfaces with total reflection X-ray fluorescence (TXRF)
- 1 January 1989
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 333 (4), 586-589
- https://doi.org/10.1007/bf00572381
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Grazing incidence X-ray fluorescence analysisNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- Trace element enrichment on a quartz glass surface used as a sample support of an X-ray spectrometer for the subnanogram rangeAnalytical and Bioanalytical Chemistry, 1979