Ellipsometry and its applications to surface examination
- 1 May 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (5), 409-416
- https://doi.org/10.1088/0022-3735/6/5/001
Abstract
No abstract availableKeywords
This publication has 81 references indexed in Scilit:
- Tribo-Ellipsometry: A New Technique to Study the Relationship of Repassivation Kinetics to Stress CorrosionCorrosion, 1972
- Optical Constants of Silver Sulfide Tarnish Films*Journal of the Optical Society of America, 1970
- Ellipsometric investigation of physisorption at low temperaturesSurface Science, 1969
- Ellipsometry for Modulated Reflection Studies of Surfaces*Journal of the Optical Society of America, 1968
- An Ellipsometric Determination of the Mechanism of Passivity of NickelJournal of the Electrochemical Society, 1966
- Measurement of oxygen adsorption on silicon by ellipsometryJournal of Physics and Chemistry of Solids, 1965
- Infrared Reflectance of Aluminum Evaporated in Ultra-High VacuumJournal of the Optical Society of America, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962
- XXVI. Optical constants of metals in the infra-red—experimental methodsJournal of Computers in Education, 1955
- XXV. Optical constants of metals in the, infra-red—Principles of measurementJournal of Computers in Education, 1955