A new type of imaging polarimeter for fast and orientation independent measurement of birefringent fine structures is proposed. The new imaging polarimeter was implemented as a polarized light microscope incorporating a precision universal compensator made of two electro-optic modulators. A video camera and computer-assisted image analysis system provide fast measurements of optical anisotropy (retardance magnitude and azimuth) in the specimen at ALL POINTS of the image constituting the field of view. The images document fine structural and molecular organization within a thin optical section of the specimen. The sensitivity of the current instrument is 0.1 nm of specimen retardance, measured in 0.43 seconds at all 640 X 480 image points. Examples of measurements of birefringent fine structures are presented.