Durability Test of Solution-Processed Organic Electrophosphorescent Devices with Small Organic Molecules
- 1 January 2006
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 45 (1R), 250
- https://doi.org/10.1143/jjap.45.250
Abstract
Durability tests of solution-processed organic electrophosphorescent devices (SP-PHOLEDs) with small organic molecules have been investigated. By using poly(ethylene dioxythiophene)/poly(styrene sulfonate) (PEDOT) as a buffer layer and indium zinc oxide (IZO) as an anode, device durability was markedly improved. The lifetime of the SP-PHOLED, defined as half-luminous at an initial luminance of 1,000 cd/m2, was 60 h.Keywords
This publication has 13 references indexed in Scilit:
- Self-Aligned Bank Formation of Organic Electroluminescent Devices Using Ink-Jet Printing MethodJapanese Journal of Applied Physics, 2004
- Developments in organic displaysMaterials Today, 2004
- Organic electrophosphorescent devices with mixed hole transport material as emission layerCurrent Applied Physics, 2004
- Green Phosphorescent Dendrimer for Light-Emitting DiodesAdvanced Materials, 2002
- Highly efficient phosphorescence from organic light-emitting devices with an exciton-block layerApplied Physics Letters, 2001
- Very high-efficiency green organic light-emitting devices based on electrophosphorescenceApplied Physics Letters, 1999
- Progress in Electroluminescent Devices Using Molecular Thin FilmsMRS Bulletin, 1997
- Single-layer white light-emitting organic electroluminescent devices based on dye-dispersed poly(N-vinylcarbazole)Applied Physics Letters, 1995
- Light-emitting diodes based on conjugated polymersNature, 1990
- Organic electroluminescent diodesApplied Physics Letters, 1987