Intrinsic dielectric response in ferroelectric nano-capacitors
- 2 October 2004
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 16 (41), L451-L456
- https://doi.org/10.1088/0953-8984/16/41/l04
Abstract
No abstract availableKeywords
All Related Versions
This publication has 44 references indexed in Scilit:
- Thickness independence of true phase transition temperatures in barium strontium titanate filmsJournal of Applied Physics, 2004
- Thickness-induced stabilization of ferroelectricity in SrRuO3/Ba0.5Sr0.5TiO3/Au thin film capacitorsApplied Physics Letters, 2002
- Observation of NanoscaleStripe Domains in FerroelectricThin FilmsPhysical Review Letters, 2002
- Temperature and thickness dependent permittivity of (Ba,Sr)TiO3 thin filmsApplied Physics Letters, 2002
- The effect of stress on the dielectric properties of barium strontium titanate thin filmsApplied Physics Letters, 1999
- Finite-Size Scaling Study of the Surface and Bulk Critical Behavior in the Random-Bond Eight-State Potts ModelPhysical Review Letters, 1998
- Critical Behavior of Random-Bond Potts ModelsPhysical Review Letters, 1997
- The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor depositionJournal of Applied Physics, 1997
- Rounding of first-order phase transitions in systems with quenched disorderPhysical Review Letters, 1989
- Random-Field Instability of the Ordered State of Continuous SymmetryPhysical Review Letters, 1975