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Atomic-Scale Engineering of the SiC-SiO2 Interface
Home
Publications
Atomic-Scale Engineering of the SiC-SiO2 Interface
Atomic-Scale Engineering of the SiC-SiO2 Interface
SP
Sokrates T. Pantelides
Sokrates T. Pantelides
GD
G. Duscher
G. Duscher
MV
M. Di Ventra
M. Di Ventra
Ryszard Buczko
Ryszard Buczko
KM
K. McDonald
K. McDonald
MH
M.B. Huang
M.B. Huang
RW
Robert A. Weller
Robert A. Weller
IB
Israel J.R. Baumvol
Israel J.R. Baumvol
FS
Fernanda Chiarello Stedile
Fernanda Chiarello Stedile
CR
C. Radtke
C. Radtke
SP
S.J. Pennycook
S.J. Pennycook
GC
G.Y. Chung
G.Y. Chung
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10 May 2000
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 338-342
,
1133-1136
https://doi.org/10.4028/www.scientific.net/msf.338-342.1133
Abstract
No abstract available
Keywords
INTERFACE STATES (OR TRAPS)
INTERFACE STRUCTURE
NITROGEN
OXIDATION
Cited by 7 articles