A bivariate autoregressive technique for analysis and classification of planar shapes
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 12 (1), 97-103
- https://doi.org/10.1109/34.41389
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
- Contour sequence moments for the classification of closed planar shapesPattern Recognition, 1987
- Classification of Partial 2-D Shapes Using Fourier DescriptorsIEEE Transactions on Pattern Analysis and Machine Intelligence, 1987
- Coding Shape Details By Means Of Frequency Analysis Of The BoundaryPublished by SPIE-Intl Soc Optical Eng ,1986
- Fourier Coding of Image BoundariesIEEE Transactions on Pattern Analysis and Machine Intelligence, 1984
- Stochastic models for closed boundary analysis: Representation and reconstructionIEEE Transactions on Information Theory, 1981
- Algorithms for Shape Analysis of Contours and WaveformsIEEE Transactions on Pattern Analysis and Machine Intelligence, 1980
- A Model-Based Vision System for Industrial PartsIEEE Transactions on Computers, 1978
- Shape Discrimination Using Fourier DescriptorsIEEE Transactions on Systems, Man, and Cybernetics, 1977
- On the Quantization of Line-Drawing DataIEEE Transactions on Systems Science and Cybernetics, 1969
- On the Encoding of Arbitrary Geometric ConfigurationsIEEE Transactions on Electronic Computers, 1961